This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at Metromeet 2007 se reafirma en su carácter internacional
METROMEET 2007 reaffirms in its international character
06/02/2007
February 6, 2007
METROMEET 2007, III International Conference on Industrial Dimensional Metrology, which will take place on 8 and 9 of March in the Palacio de Congresos and the Euskalduna Jauregia Bilbao music has received a great reception from the international metrology community.
The quotation is presented in this way as a forum that provides a good opportunity to educate professionals and opens the door to discover the keys to increase the productivity of the sector at the global level.
In this sense, there is nothing more significant than the high percentage of international registrations received one month short of the start of the Conference, while the previous year was a high number, on this occasion, reaching 60 per cent of the total. In this way, of this percentage of inscriptions, 70 per cent correspond to registrations of European origin and the other 30 percent to America from inscriptions.
Also, people interested in attending Metromeet 2007, will benefit of a 10 percent discount if they perform their records by February 9, 2007. The inscriptions can be made through the website of the International Conference: http://www.metromeet.org/es/registration/register.htm either via e-mail to the address info@metromeet.org.
