METROMEET 2008 highlights the relevance of the increase in accuracy in metrology
April 25, 2008
Also, attendees had the opportunity to witness demonstrations of machines and systems of measurement in situ as the machine of measurement with the company Trimek optiscan.
The Conference was sponsored by the Innovalia Association, Lighthouse, AAT and Renishaw. The opening ceremony was presided over by Izaskun Artetxe, representative of the Dept. of innovation and economic promotion of the Diputación Foral de Bizkaia, partner also in this edition.
During the Panel discussion that preceded the conclusion of the event, experts of benchmark as Chris Evans, of the Corporation Zygo and Maurizio Ercole, President of IACMM (International Association of manufacturers of CMMs) agreed in pointing out that events like Metromeet should be an unmissable annual event for professionals of metrology, and encouraged all the present to engage in spreading the existence of this forum at the global level.
After the Conference, Jesus de la Maza; the Innovalia Association President, presented the award to the best presentation Chris Evans by his explanation on the importance of the increase in accuracy in metrology and the manufacturing processes, but not before convening the next edition of the 2009 attendeesto be held on 19 and 20 March.